Maîtriser le Vieillissement des Transistors de Puissance

Maîtriser le Vieillissement des Transistors de Puissance

Douha Othmen / Stéphane Lefebvre / Tarek Ben Salah

89,51 €
IVA incluido
Disponible
Editorial:
KS OmniScriptum Publishing
Año de edición:
2025
ISBN:
9786208822989
89,51 €
IVA incluido
Disponible

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Cet ouvrage présente une étude expérimentale approfondie du comportement des transistors JFET SiC destinés aux applications aéronautiques exigeantes. Nous y décrivons une méthodologie complète incluant la conception d’un banc d’essais automatisé via LabView, la réalisation de tests de robustesse pour déterminer l’énergie critique, ainsi que des essais de vieillissement accéléré permettant de suivre l’évolution des paramètres électriques. Les résultats obtenus mettent en évidence des indicateurs de dégradation fiables et ouvrent des perspectives intéressantes pour la conception de systèmes électroniques plus résistants dans des environnements extrêmes.

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