Controlo do envelhecimento dos transístores de potência

Controlo do envelhecimento dos transístores de potência

Douha Othmen / Stéphane Lefebvre / Tarek Ben Salah

90,75 €
IVA incluido
Disponible
Editorial:
KS OmniScriptum Publishing
Año de edición:
2025
ISBN:
9786208939496
90,75 €
IVA incluido
Disponible

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Sobre IBD

Este livro apresenta um estudo experimental aprofundado do comportamento dos transístores SiC JFET para aplicações aeroespaciais exigentes. É descrita uma metodologia completa, incluindo a conceção de um banco de ensaios automatizado utilizando LabView, testes de robustez para determinar a energia crítica e testes de envelhecimento acelerado para monitorizar as alterações nos parâmetros eléctricos. Os resultados obtidos evidenciam indicadores de degradação fiáveis e abrem perspectivas interessantes para a conceção de sistemas electrónicos mais resistentes em ambientes extremos.

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