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Advanced Test Methods for SRAMs

Advanced Test Methods for SRAMs

Alberto Bosio / Luigi Dilillo / Patrick Girard

133,06 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2009
Materia
Diseño asistido por ordenador (CAD)
ISBN:
9781441909374
133,06 €
IVA incluido
Disponible

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Sobre IBD

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.

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Otros libros del autor

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