Alberto Bosio / Luigi Dilillo / Patrick Girard
Librería Samer Atenea
Librería Aciertas (Toledo)
Kálamo Books
Librería Perelló (Valencia)
Librería Elías (Asturias)
Donde los libros
Librería Kolima (Madrid)
Librería Proteo (Málaga)
Basics on SRAM Testing.- Resistive-Open Defects in Core-Cells.- Resistive-Open Defects in Pre-charge Circuits.- Resistive-Open Defects in Address Decoders.- Resistive-Open Defects in Write Drivers.- Resistive-Open Defects in Sense Amplifiers.- Faults Due to Process Variations in SRAMs.- Diagnosis and Design-for-Diagnosis.