LIBROS DEL AUTOR: luigi dilillo

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  • Advanced Test Methods for SRAMs
    Alberto Bosio / Luigi Dilillo / Patrick Girard
    Basics on SRAM Testing.- Resistive-Open Defects in Core-Cells.- Resistive-Open Defects in Pre-charge Circuits.- Resistive-Open Defects in Address Decoders.- Resistive-Open Defects in Write Drivers.- Resistive-Open Defects in Sense Amplifiers.- Faults Due to Process Variations in SRAMs.- Diagnosis and Design-for-Diagnosis. ...
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    146,70 €