Arman Vassighi / Manoj Sachdev
Librería Samer Atenea
Kálamo Books
Librería Elías (Asturias)
Librería Kolima (Madrid)
Librería Proteo (Málaga)
Power, Junction Temperature, and Reliability.- Burn-in as a Reliability Screening Test.- Thermal and Electrothermal Modeling.- Thermal Runaway and Thermal Management.- Low Temperature CMOS Operation.