LIBROS DEL AUTOR: manoj sachdev

4 resultados para LIBROS DEL AUTOR: manoj sachdev

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  • Thermal and Power Management of Integrated Circuits
    Arman Vassighi / Manoj Sachdev
    Power, Junction Temperature, and Reliability.- Burn-in as a Reliability Screening Test.- Thermal and Electrothermal Modeling.- Thermal Runaway and Thermal Management.- Low Temperature CMOS Operation. ...
    Disponible

    195,86 €

  • CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    Andrei Pavlov / Manoj Sachdev
    Foreword. Preface. Acronyms. 1. INTRODUCTION AND MOTIVATION. 1.1 Motivation. 1.2 SRAM in the Computer Memory Hierarchy. 1.3 Technology Scaling and SRAM Design and Test. 1.4 SRAM test economics. 1.5 SRAM Design and Test Tradeoffs. 1.6 Redundancy. 2. SRAM CIRCUIT DESIGN AND OPERATION. 2.1 Introduction. 2.2 SRAM block structure. 2.3 SRAM cell design. 2.4 Cell layout considerations...
    Disponible

    220,36 €

  • ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    Hossein Sarbishaei / Manoj Sachdev / Oleg Semenov
    Dedication. Preface. Acknowledgments. 1. INTRODUCTION. 1. Nature of ESD phenOmena. 2. ESD failures in nanometric technologies. 3. Circuit reliability: ESD models. 4. ESD challenges for advanced CMOS technologies. 5. ESD design window. 6. Book objective and organization. 7. Summary. 2. ESD MODELS AND TEST METHODS. 1. Introduction. 2. ESD zapping modes. 3. HBM model. 4. MM model....
    Disponible

    244,80 €

  • Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Jose Pineda de Gyvez / Manoj Sachdev
    The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, ...
    Disponible

    244,29 €