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Electromagnetic material characterization is the process of determining the complex permittivity and permeability of a material. A new waveguide material measurement technique is developed to reduce test sample size requirements for low-frequency applications. Specifically, a waveguide sample holder having a reduced aperture is utilized to decrease the time and cost spent producing large precision test samples. This type of sample holder causes a disruption in the waveguide-wall surface currents that results in the excitation of higher-order modes. This thesis will demonstrate how these higher-order modes can be accommodated using a modal-analysis technique, thus resulting in the ability to measure smaller samples mounted in large waveguides and still determine the constitutive parameters of the materials at the desired frequencies.This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.
