Fundamentals of Nanoscale Film Analysis

Fundamentals of Nanoscale Film Analysis

James W. Mayer / L.C. Feldman / Terry L. Alford

119,95 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2007
ISBN:
9780387292601
119,95 €
IVA incluido
Disponible

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Sobre IBD

From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.

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