LIBROS DEL AUTOR: james w mayer

9 resultados para LIBROS DEL AUTOR: james w mayer

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  • Ion Beam Analysis
    James W. Mayer / Michael Nastasi / Yongqiang Wang
    This book explains the basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. It starts with coverage of the fundamentals of ion beam analysis, including kinematics, ion stopping, R ...
    Disponible

    119,53 €

  • Ion Beam Analysis
    James W. Mayer / Michael Nastasi / Yongqiang Wang
    Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization.The book explains how ions interact with solids and describes what information...
    Disponible

    341,36 €

  • Silver Metallization
    Daniel Adams / James W. Mayer / Terry L. Alford
    IntroductionSilver Thin Film AnalysisDiffusion Barriers and Self-encapsulationThermal StabilitySilver Electromigration ResistanceIntegration IssuesSummary ...
    Disponible

    208,43 €

  • Fundamentals of Nanoscale Film Analysis
    James W. Mayer / L.C. Feldman / Terry L. Alford
    An Overview: Concepts, Units, and the Bohr Atom.- Atomic Collisions and Backscattering Spectrometry.- Energy Loss of Light Ions and Backscattering Depth Profiles.- Sputter Depth Profiles and Secondary Ion Mass Spectroscopy.- Ion Channeling.- Electron-Electron Interactions and the Depth Sensitivity of Electron Spectroscopies.- X-ray Diffraction.- Electron Diffraction.- Photon Ab...
    Disponible

    121,33 €

  • Ion Implantation and Synthesis of Materials
    James W. Mayer / Michael Nastasi
    General Features and Fundamental Concepts.- Particle Interactions.- Dynamics of Binary Elastic Collisions.- Cross-Section.- Ion Stopping.- Ion Range and Range Distribution.- Displacements and Radiation Damage.- Channeling.- Doping, Diffusion and Defects in Ion-Implanted Si.- Crystallization and Regrowth of Amorphous Si.- Si Slicing and Layer Transfer: Ion-Cut.- Surface Erosion ...
    Disponible

    170,86 €

  • Patterns of Light
    James W. Mayer / Steven Beeson
    Any student or engineer working in optics or the field of laser technology will find this a fascinating read. The book begins by addressing the properties of light as seen in the everyday world: events such as refraction in a pool, lenses in the form of glasses, the colors of objects, and atmospheric events. Latter chapters explain these events at the...
    Disponible

    245,32 €

  • Silver Metallization
    Daniel Adams / James W. Mayer / Terry L. Alford
    Here is the first book to discuss the current understanding of silver metallization and its potential as a future interconnect material for integrated circuit technology. With the lowest resistivity of all metals, silver is an attractive interconnect material for higher current densities and faster switching speeds in integrated circuits. Over the pas...
    Disponible

    207,05 €

  • Fundamentals of Nanoscale Film Analysis
    James W. Mayer / L.C. Feldman / Terry L. Alford
    From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a f...
    Disponible

    119,95 €

  • Ion Implantation and Synthesis of Materials
    James W. Mayer / Michael Nastasi
    Ion implantation is one of the key processing steps in silicon integrated circuit technology. Some integrated circuits require up to 17 implantation steps and circuits are seldom processed with less than 10 implantation steps. Controlled doping at controlled depths is an essential feature of implantation. Ion beam processing can also be used to improv...
    Disponible

    132,61 €