CTL for Test Information of Digital ICs

CTL for Test Information of Digital ICs

Rohit Kapur

133,06 €
IVA incluido
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Editorial:
Springer Nature B.V.
Año de edición:
2002
ISBN:
9781402072932

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From the reviews: '[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields.' Microelectronics Reliability

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    From the reviews: '[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields.' Microelectronics Reliability ...
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