CTL for Test Information of Digital ICs

CTL for Test Information of Digital ICs

Rohit Kapur

134,41 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2013
ISBN:
9781475778007
134,41 €
IVA incluido
Disponible

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Sobre IBD

From the reviews: '[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields.' Microelectronics Reliability

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Otros libros del autor

  • CTL for Test Information of Digital ICs
    Rohit Kapur
    From the reviews: '[...] a welcome addition to the literature. [...] This book promises to make a valuable contribution to the education of graduate students in electrical and computer engineering, and a very useful addition to the library of the maturer investigator in SoC designs or related fields.' Microelectronics Reliability ...