CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Andrei Pavlov / Manoj Sachdev

206,71 €
IVA incluido
Consulta disponibilidad
Editorial:
Springer Nature B.V.
Año de edición:
2008
ISBN:
9781402083624

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Sobre IBD

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

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