Trace-Based Post-Silicon Validation for VLSI Circuits

Trace-Based Post-Silicon Validation for VLSI Circuits

Qiang Xu / Xiao Liu

134,36 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2013
ISBN:
9783319005324
134,36 €
IVA incluido
Disponible

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This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices.

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Otros libros del autor

  • Trace-Based Post-Silicon Validation for VLSI Circuits
    Qiang Xu / Xiao Liu
    This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective. A series of automatic tracing solutions and innovative design fo...
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