Thermal Testing of Integrated Circuits

Thermal Testing of Integrated Circuits

Altet / Josep Altet / Moshe Kress

156,28 €
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Editorial:
Springer Nature B.V.
Año de edición:
2002
ISBN:
9781402070761

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Sobre IBD

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

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