Thermal-Aware Testing of Digital VLSI Circuits and Systems

Thermal-Aware Testing of Digital VLSI Circuits and Systems

Santanu Chattopadhyay

117,06 €
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Editorial:
Taylor & Francis Ltd
Año de edición:
2018
ISBN:
9780815378822

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Sobre IBD

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

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