Test and Diagnosis for Small-Delay Defects

Test and Diagnosis for Small-Delay Defects

Ke Peng / Krishnendu Chakrabarty / Mohammad Tehranipoor

158,78 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2014
ISBN:
9781489989529
158,78 €
IVA incluido
Disponible

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Sobre IBD

Introduction to VLSI Testing.- Delay Test and System-Delay Defects.- Long Path-Based Hybrid Method.- Process Variations- and Crosstalk-Aware Pattern Selection.- Power Supply Noise- and Crosstalk-Aware Hybrid Method.- SDD-Based Hybrid Method.- Maximizing Crosstalk Effect on Critical Paths.- Maximizing Power Supply Noise on Critical Paths.- Faster-than-at-speed Test.- Introduction to Diagnosis.- Diagnosing Noise-Induced SDDs by Using Dynamic SDF.

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Otros libros del autor

  • Test and Diagnosis for Small-Delay Defects
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