Scanning Microscopy for Nanotechnology

Scanning Microscopy for Nanotechnology

 

307,92 €
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Editorial:
Springer Nature B.V.
Año de edición:
2006
ISBN:
9780387333250

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Sobre IBD

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

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