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Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI Circuits

Bashir M. Al-Hashimi / Nicola Nicolici

134,38 €
IVA incluido
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Editorial:
Springer Nature B.V.
Año de edición:
2010
Materia
Medicina: cuestiones generales
ISBN:
9781441953155
134,38 €
IVA incluido
Disponible

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Sobre IBD

This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths.

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Otros libros del autor

  • Power-Constrained Testing of VLSI Circuits
    Bashir M. Al-Hashimi / Nicola Nicolici
    This text focuses on techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of the VLSI design flow. It surveys existing techniques and presents several test automation techniques for reducing power in scan-based sequential circuits and BIST data paths. ...