Noise Contamination in Nanoscale VLSI Circuits

Noise Contamination in Nanoscale VLSI Circuits

Selahattin Sayil

48,52 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2022
ISBN:
9783031127526
48,52 €
IVA incluido
Disponible

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Sobre IBD

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.

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Otros libros del autor

  • Noise Contamination in Nanoscale VLSI Circuits
    Selahattin Sayil
    This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer...
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  • Soft Error Mechanisms, Modeling and Mitigation
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    This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel ...
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  • Soft Error Mechanisms, Modeling and Mitigation
    Selahattin Sayil
    This book introduces readers to various radiation soft-error mechanisms such as soft delays, radiation induced clock jitter and pulses, and single event (SE) coupling induced effects. In addition to discussing various radiation hardening techniques for combinational logic, the author also describes new mitigation strategies targeting commercial designs. Coverage includes novel ...