Egor Sogomonyan / Michael Gössel / Vitaly Ocheretny
Librería Samer Atenea
Librería Aciertas (Toledo)
Kálamo Books
Librería Perelló (Valencia)
Librería Elías (Asturias)
Donde los libros
Librería Kolima (Madrid)
Librería Proteo (Málaga)
1 Introduction. 2 Physical Faults and Functional Errors. 2.1 Stuck-at Faults. 2.2 Bridging Faults. 2.3 CMOS Stuck-open and Stuck-on Faults. 2.4 Delay Faults. 2.5 Transient Faults. 2.6 Functional Error Model. 2.7 Output Dependencies. 2.8 Self-Testing and Self-Checking. 2.9 Faults and Errors in Submicron Technologies. 3 Principles of Concurrent Checking. 3.1 Duplication and Comparison. 3.2 Block Codes for Error Detection. 3.3 Parity and Group Parity Checking. 3.4 Odd and Even Error Detection. 3.5 Code-Disjoint Circuits. 3.6 Error Detection by Complementary Circuits. 3.7 General Method for the Design of Error Detection Circuits. 3.8 Self-Dual Error Detection. 3.9. Error Detection with Soft Error Correction. 4. Concurrent Checking for the Adders. 4.1 Basic Types of Adders. 4.2 Parity Checking for Adders. 4.3 Self-Checking Adders. References. Index.
