MOS Interface Physics, Process and Characterization

MOS Interface Physics, Process and Characterization

Shengkai Wang / Xiaolei Wang

91,19 €
IVA incluido
Disponible
Editorial:
Taylor & Francis Ltd
Año de edición:
2024
ISBN:
9781032106281
91,19 €
IVA incluido
Disponible

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Sobre IBD

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

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Otros libros del autor

  • MOS Interface Physics, Process and Characterization
    Shengkai Wang / Xiaolei Wang
    The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics. ...
    Disponible

    169,64 €