Micrometers, Calipers and Gages

Micrometers, Calipers and Gages

Forrest W. Bear / Forrest WBear / Thomas A. Hoerner / Thomas AHoerner

3,90 €
IVA incluido
Disponible
Editorial:
Rowman & Littlefield Publishing Group Inc
Año de edición:
1969
ISBN:
9780913163030
3,90 €
IVA incluido
Disponible

Selecciona una librería:

  • Donde los libros
  • Librería 7artes
  • Librería Elías (Asturias)
  • Librería Kolima (Madrid)
  • Librería Proteo (Málaga)

This is an educational tool to be used in a classroom setting or by commercial firms and other agencies for inservice training programs. This manual contains illustrations of the different measuring instruments, an explanation of their construction, and how to use the instruments for specific applications. The tools explained are micrometers, vernier calipers, thickness gages, and wire gages. Classroom exercises and laboratory worksheets are included for instructional and evaluation purposes.

Artículos relacionados

  • An Introduction to Uncertainty in Measurement Using the Gum
    Bob Frenkel / Les Kirkup
    ...
    Disponible

    81,17 €

  • Introduction to Focused Ion Beam Nanometrology
    David C. Cox / David CCox
    This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. ...
    Disponible

    125,54 €

  • An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
    Sarah Fearn
    The study of dark matter, in both astrophysics and particle physics, has emerged as one of the most active and exciting topics of research in recent years. This book reviews the history behind the discovery of missing mass (or unseen mass) in the Universe, and ties this into the proposed extensions to the Standard Model of Particle Physics (such as Supersymmetry), which were b...
    Disponible

    37,89 €

  • Nanometrology Using the Transmission Electron Microscope
    Vlad Stolojan
    The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understand...
    Disponible

    88,12 €

  • Advanced Mathematical and Computational Tools in Metrology and Testing XI
    This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adapted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools in Metrology and Testing conference held at the University of Strathclyde, Glasgow, in September...
    Disponible

    203,12 €

  • MEM12023 Perform engineering measurements
    Warren Blackadder
    The unit of competency defines the skills and knowledge required to perform measurements requiring straightforward use of mechanical measuring devices which incorporate visual inspections representing units of measurement and associated calculations in a range of manufacturing, engineering and related environments. Measurements may be expressed in metric or imperial units.Elect...
    Disponible

    25,20 €