Dmitry Vostokov / Software Diagnostics Institute
Librería Samer Atenea
Librería Aciertas (Toledo)
Kálamo Books
Librería Perelló (Valencia)
Librería Elías (Asturias)
Donde los libros
Librería Kolima (Madrid)
Librería Proteo (Málaga)
This reference volume consists of revised, edited, cross-referenced, and thematically organized selected articles from Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org) and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog) about software diagnostics, root cause analysis, debugging, crash and hang dump analysis, software trace and log analysis written in June 2017 - November 2018 for software engineers developing and maintaining products on Windows platforms, quality assurance engineers testing software, technical support and escalation engineers dealing with complex software issues, security researchers, reverse engineers, malware and memory forensics analysts. This volume is fully cross-referenced with volumes 1 – 10 and features: - 8 new crash dump analysis patterns with selected downloadable example memory dumps; - 15 new software trace and log analysis patterns; - Introduction to diagnostic operads; - Summary of mathematical concepts in software diagnostics and software data analysis; - Introduction to software diagnostics engineering; - Introduction to narrachain; - Introduction to diagnostics-driven development; - Principles of integral diamathics; - Introduction to meso-problem solving using meso-patterns; - Introduction to lego log analysis; - Introduction to artificial chemistry approach to software trace and log analysis; - WinDbg notes; - Updated C++17 source code of some previously published tools; - Selected entries from debugging dictionary; - List of recommended modern C++ books; - List of recommended books about algorithms; - Author's current CV; - Author's past resume written in WinDbg and GDB styles. This volume also includes articles from the former Crash Dump Analysis blog not previously available in print form.
