Low-Frequency Noise in Advanced MOS Devices

Low-Frequency Noise in Advanced MOS Devices

Martin Haartman / Mikael Östling

195,67 €
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Editorial:
Springer Nature B.V.
Año de edición:
2010
ISBN:
9789048174720
195,67 €
IVA incluido
Disponible

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Sobre IBD

Authors. Preface. Acknowledgments.Chapter 1 Fundamental noise mechanisms. Introduction. Basic noise theory. Fundamental noise sources. Noise circuit analysis.Chapter 2 Noise characterization. Introduction. Low-frequency noise measurements. Noise as a diagnostic tool.Chapter 3 1/f noise in MOSFETs - origins and modelling. Introduction. MOSFET noise model. Number fluctuations, Mobility fluctuations. Impact of substrate voltage. Compact noise models. Input referred noise.Chapter 4 1/f Noise performance of advanced CMOS devices. Introduction. 1/f noise performance overview. 1/f noise performance of ultra-scaled devices. SiGe channel pMOSFETs. Strained Si devices. Silicon-on-insulator devices. MOSFETs with high-k gate dielectrics. Metal gate devices. Multiple gate devices.Chapter 5 Introduction to noise in RF/analog circuits. Introduction. Upconversion of noise. Voltage controlled oscillator (VCO). Mixer. Low-Noise Amplifier (LNA). Appendix I List of Symbols.Appendix II List of Acronyms.Appendix III Solutions to problems.Index.

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