Integrated Circuit Defect-Sensitivity

Integrated Circuit Defect-Sensitivity

Jose Pineda De Gyvez

134,37 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2014
ISBN:
9781461363835
134,37 €
IVA incluido
Disponible

Selecciona una librería:

  • Librería Samer Atenea
  • Librería Aciertas (Toledo)
  • Kálamo Books
  • Librería Perelló (Valencia)
  • Librería Elías (Asturias)
  • Donde los libros
  • Librería Kolima (Madrid)
  • Librería Proteo (Málaga)

The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards some microelectronics industries realized that their survival may depend on a better integration between technology-and design-laboratories. For years the 'silicon foundry' concept had suggested a fairly rigorous separation between the two areas. The expectation was that many small design companies would share the investment into the extremely costful Silicon fabrication plants while designing large lots of application-specific integrated circuits (ASIC’s). Those fabrication plants would be concentrated with only a few market leaders.

Artículos relacionados

  • Video Surveillance Techniques and Technologies
    Vesna Zeljkovic
    Security video surveillance systems, such as homeland security and national defense, rely on specific mathematical algorithms in order to run effectively. It is essential for these parameters to be understood in order to design and create a successful system. Video Surveillance Techniques and Technologies presents empirical research and acquired experience on the original solut...
  • Swarm Intelligence for Electric and Electronic Engineering
    With growing developments in artificial intelligence and focus on swarm behaviors; algorithms have been utilized in solving a variety of problems in the field of engineering. This approach has been specifically suited to face the challenges in electric and electronic engineering. Swarm Intelligence for Electric and Electronic Engineering provides an exchange of knowledge on the...
  • Multirate Systems
    Gordana Jovanovic-Dolecek
    ...
  • Advanced Instrument Engineering
    Lay-Ekuakille
    Measurement technologies and instrumentation have a multidisciplinary impact in the field of applied sciences. These engineering technologies are necessary in processing information required for renewable energy, biotechnology, power quality, and nanotechnology. Advanced Instrument Engineering: Measurement, Calibration, and Design presents theoretical and practical aspects on t...
  • Linear Systems Theory
    João P. Hespanha
    A fully updated textbook on linear systems theoryLinear systems theory is the cornerstone of control theory and a well-established discipline that focuses on linear differential equations from the perspective of control and estimation. This updated second edition of Linear Systems Theory covers the subject’s key topics in a unique lecture-style format, making the book easy to ...
  • Instrument Transformers
    P.K. Pattanaik
    "Instrument Transformers" serves as an indispensable guide for electrical engineers and professionals navigating the complexities of measuring high-voltage currents and potentials. In the realm of electrical engineering, direct measurement of voltages and currents in the "kilo" or "mega" range presents significant challenges, not only due to the sheer magnitude of these values ...
    Disponible

    39,10 €

Otros libros del autor

  • Integrated Circuit Defect-Sensitivity
    José Pineda de Gyvez
    The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault t...