High Quality Test Pattern Generation and Boolean Satisfiability

High Quality Test Pattern Generation and Boolean Satisfiability

Rolf Drechsler / Stephan Eggersglüß

158,88 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2014
ISBN:
9781489988478
158,88 €
IVA incluido
Disponible

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Sobre IBD

Part I: Preliminaries and Previous Work.- Circuits and Testing.- Boolean Satisfiability.- ATPG Based on Boolean Satisfiability.- Part II: New SAT Techniques and their Application in ATPG.- Dynamic Clause Activation.- Circuit-based Dynamic Learning.- Part III: High Quality Delay Test Generation.- High Quality ATPG for Transition Faults.- Path Delay Fault Model.- Summary and Outlook.

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Otros libros del autor

  • High Quality Test Pattern Generation and Boolean Satisfiability
    Rolf Drechsler / Stephan Eggersglüß
    This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation pat...