Failure Analysis of Integrated Circuits

Failure Analysis of Integrated Circuits

Lawrence C. Wagner

207,78 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2012
ISBN:
9781461372318
207,78 €
IVA incluido
Disponible

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Sobre IBD

This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

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Otros libros del autor

  • Failure Analysis of Integrated Circuits
    Lawrence C. Wagner
    This 'must have' reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. ...