Duane Boning / Michael Orshansky / Sani Nassif
Librería Samer Atenea
Librería Aciertas (Toledo)
Kálamo Books
Librería Perelló (Valencia)
Librería Elías (Asturias)
Donde los libros
Librería Kolima (Madrid)
Librería Proteo (Málaga)
Sources of Variability.- Front End Variability.- Back End Variability.- Environmental Variability.- Variability Characterization and Analysis.- Test Structures For Variability.- Statistical Foundations Of Data Analysis And Modeling.- Design Techniques for Systematic Manufacturability Problems.- Lithography Enhancement Techniques.- Ensuring Interconnect Planarity.- Statistical Circuit Design.- Statistical Circuit Analysis.- Statistical Static Timing Analysis.- Leakage Variability And Joint Parametric Yield.- Parametric Yield Optimization.- Conclusions.