Charged Semiconductor Defects

Charged Semiconductor Defects

Edmund G. Seebauer / Meredith C. Kratzer

244,49 €
IVA incluido
Disponible
Editorial:
Springer Nature B.V.
Año de edición:
2010
ISBN:
9781849968201
244,49 €
IVA incluido
Disponible

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Sobre IBD

Introduction Fundamentals of Defect Ionization and Transport Experimental and Computational Characterization Trends in Charged Defect Behavior Intrinsic Defects: Structure Intrinsic Defects: Ionization Thermodynamics Intrinsic Defects: Diffusion Extrinsic Defects

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Otros libros del autor

  • Charged Semiconductor Defects
    Edmund G. Seebauer / Meredith C. Kratzer
    Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of 'defect engineering'. For example, in the bulk, charging significantly affects the total concentration of defects that are available to mediate phenomena such as solid-state diffusion. Surface defects play an important role in mediati...