LIBROS DEL AUTOR: vishwani agrawal

8 resultados para LIBROS DEL AUTOR: vishwani agrawal

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  • Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
    M. Bushnell / Vishwani Agrawal
    The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most pr...
    Disponible

    161,68 €

  • Neural Models and Algorithms for Digital Testing
    M. Bushnell / S.T. Chadradhar / Vishwani Agrawal
    References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy...
    Disponible

    134,34 €

  • Concurrent and Comparative Discrete Event Simulation
    Ernst G. Ulrich / Jack H. Arabian / Vishwani D. Agrawal
    Concurrent simulation is over twenty years old. During that pe­ riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation....
    Disponible

    134,32 €

  • Concurrent and Comparative Discrete Event Simulation
    Ernst G. Ulrich / Jack H. Arabian / Vishwani D. Agrawal
    Concurrent simulation is over twenty years old. During that pe­ riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome ...
    Disponible

    48,25 €

  • Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
    M. Bushnell / Vishwani Agrawal
    The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most pr...
    Disponible

    162,21 €

  • Concurrent and Comparative Discrete Event Simulation
    Ernst G. Ulrich / Jack H. Arabian / Vishwani D. Agrawal
    Concurrent simulation is over twenty years old. During that pe­ riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation....
    Disponible

    132,96 €

  • Neural Models and Algorithms for Digital Testing
    M. Bushnell / S.T. Chadradhar / Vishwani Agrawal
    References . . . . . . . . . . . . . . . . . . . . . . . . . . . . 82 9 QUADRATIC 0-1 PROGRAMMING 8S 9. 1 Energy Minimization 86 9. 2 Notation and Tenninology . . . . . . . . . . . . . . . . . 87 9. 3 Minimization Technique . . . . . . . . . . . . . . . . . . 88 9. 4 An Example . . . . . . . . . . . . . . . . . . . . . . . . 92 9. 5 Accelerated Energy...
    Disponible

    132,97 €

  • Unified Methods for VLSI Simulation and Test Generation
    Kwang-Ting (Tim) Cheng / Vishwani D. Agrawal
    ...
    Disponible

    133,17 €