LIBROS DEL AUTOR: thomas s olney

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  • A Simple Non-Destructive Method for Characterizing Nondispersive, Low-Loss Dielectrics
    Thomas S. Olney
    It is shown how permittivity can be extracted via time domain reflection data from a perfect electric conductor (PEC) backed planar sample of a low-loss, non-dispersive dielectric using two rectangular Ku-band waveguide aperture probes with attached PEC flange plates of the same geometry but different dimensions. Of critical importance is being able to identify the reflection f...
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