LIBROS DEL AUTOR: tan cher ming

6 resultados para LIBROS DEL AUTOR: tan cher ming

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  • Reliability Analysis of Electrotechnical Devices
    Cher Ming Tan
    This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards. ...
    Disponible

    62,03 €

  • Graphene and VLSI Interconnects
    Cher-Ming Tan / Udit Narula / Vivek Sangwan
    Copper (Cu) has been used as an interconnection material in the semiconductor industry for years owing to its best balance of conductivity and performance. However, it is running out of steam as it is approaching its limits with respect to electrical performance and reliability. Graphene is a non-metal material, but it can help to improve electromigration (EM) performance of Cu...
    Disponible

    201,95 €

  • Electromigration Modeling at Circuit Layout Level
    Cher Ming Tan / Feifei He
    Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability...
    Disponible

    68,06 €

  • Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
    Cher Ming Tan / Wei Li / Zhenghao Gan
    Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.To help reade...
    Disponible

    135,82 €

  • Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
    Cher Ming Tan / Wei Li / Zhenghao Gan
    ...
    Disponible

    134,47 €

  • ELECTROMIGRATION IN ULSI INTERCONNECTI..
    CHER MING TAN / TAN CHER MING
    ...
    Disponible

    127,87 €