LIBROS DEL AUTOR: richard g forbes

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  • Atom-Probe Tomography
    Michael K. Miller / Richard G. Forbes
    Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying phy...
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