LIBROS DEL AUTOR: m ray mercer

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  • Assessing Fault Model and Test Quality
    Kenneth M. Butler / M. Ray Mercer
    For many years, the dominant fault model in automatic test pattern gen­ eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing...
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