LIBROS DEL AUTOR: juin j liou

6 resultados para LIBROS DEL AUTOR: juin j liou

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  • On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
    Jean-Jacques Hajjar / Juin J. Liou / Qiang Cui
    This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protectio...
    Disponible

    123,35 €

  • Electrostatic Discharge Protection
    Juin J. Liou
    Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. In an ESD event, a finite amount of charge is transferred from one object (i.e., human body) to another (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time. Thus, more than 35 percent of single-event chip dam...
    Disponible

    389,42 €

  • On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits
    Jean-Jacques Hajjar / Juin J. Liou / Juin JLiou / Qiang Cui
    This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protectio...
    Disponible

    134,30 €

  • Semiconductor Device Physics and Simulation
    J.S. Yuan / Juin Jei Liou
    The advent of the microelectronics technology has made ever-increasing numbers of small devices on a same chip. The rapid emergence of ultra-large-scaled-integrated (ULSI) technology has moved device dimension into the sub-quarter-micron regime and put more than 10 million transistors on a single chip. While traditional closed-form analytical models f...
    Disponible

    209,65 €

  • Semiconductor Process Reliability in Practice
    Juin J. Liou / Waisum Wong / Zhenghao Gan
    ...
    Disponible

    159,59 €

  • Semiconductor Device Physics and Simulation
    J.S. Yuan / Juin Jei Liou
    The advent of the microelectronics technology has made ever-increasing numbers of small devices on a same chip. The rapid emergence of ultra-large-scaled-integrated (ULSI) technology has moved device dimension into the sub-quarter-micron regime and put more than 10 million transistors on a single chip. While traditional closed-form analytical models f...
    Disponible

    210,17 €