LIBROS DEL AUTOR: ireneusz mrozek

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  • Multi-run Memory Tests for Pattern Sensitive Faults
    Ireneusz Mrozek
    This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.  The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to i...
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