LIBROS DEL AUTOR: feifei he

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  • Electromigration Modeling at Circuit Layout Level
    Cher Ming Tan / Feifei He
    Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability...
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    68,06 €