LIBROS DEL AUTOR: evgeni gusev

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  • Defects in HIgh-k Gate Dielectric Stacks
    Evgeni Gusev
    The goal of this NATO Advanced Research Workshop (ARW) entitled 'Defects in Advanced High-k Dielectric Nano-electronic Semiconductor Devices', which was held in St. Petersburg, Russia, from July 11 to 14, 2005, was to examine the very complex scientific issues that pertain to the use of advanced high dielectric constant (high-k) materials in next gene...
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