LIBROS DEL AUTOR: david c joy

5 resultados para LIBROS DEL AUTOR: david c joy

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  • Subaltern Historiography
    David C.I. Joy / David C.IJoy / Ebenezer Shinekumar
    These essays truly propose a paradigm for reading the history and theology from a subaltern viewpoint. Since the essays are prepared by scholars across the globe, it will create a horizon of vision in terms of methodology and hermeneutics. It is significant to note that the essays reflect a wide range of postmodern and postcolonial reading strategies for evaluating the history ...
    Disponible

    21,85 €

  • Helium Ion Microscopy
    David C. Joy
    Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century. Topics covered include the principles, operation, and performance of the G...
    Disponible

    67,91 €

  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / David C. Joy / Joseph Goldstein
    This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the u...
    Disponible

    137,44 €

  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / David C. Joy / Joseph Goldstein
    In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vap...
    Disponible

    51,05 €

  • Monte Carlo Modeling for Electron Microscopy and Microanalysis
    David C. Joy
    This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering ...
    Disponible

    520,21 €