LIBROS DEL AUTOR: dale e newbury

7 resultados para LIBROS DEL AUTOR: dale e newbury

dale e newbury Eliminar filtro Quitar filtros
  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / Joseph I. Goldstein / Joseph R. Michael
    This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researc...
    Disponible

    50,56 €

  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / Joseph Goldstein / Patrick Echlin
    This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developing this textbook. The materi...
    Disponible

    45,94 €

  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / David C. Joy / Joseph Goldstein
    This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the u...
    Disponible

    137,44 €

  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / Joseph Goldstein / Patrick Echlin
    This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975. The interaction of the authors with students at the Short Course on Scanning Electron Microscopy and X-Ray Microanalysis held annually at Lehigh University has helped greatly in developin...
    Disponible

    132,01 €

  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / Joseph Goldstein / Patrick Echlin
    In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these...
    Disponible

    137,55 €

  • Scanning Electron Microscopy and X-Ray Microanalysis
    Dale E. Newbury / David C. Joy / Joseph Goldstein
    In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vap...
    Disponible

    51,05 €

  • Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
    Charles E. Lyman / Dale E. Newbury / Joseph Goldstein
    During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron bea...
    Disponible

    133,29 €