LIBROS DEL AUTOR: cher ming tan

2 resultados para LIBROS DEL AUTOR: cher ming tan

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  • Electromigration Modeling at Circuit Layout Level
    Cher Ming Tan / Feifei He
    Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels. Electromigration (EM) of interconnects has now become the dominant failure mechanism that determines the circuit reliability...
    Disponible

    68,06 €

  • Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
    Cher Ming Tan / Wei Li / Zhenghao Gan
    Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs has become widespread and continues to lead to a much better understanding of reliability physics.To help reade...
    Disponible

    135,82 €