LIBROS DEL AUTOR: brent fultz

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  • Transmission Electron Microscopy and Diffractometry of Materials
    Brent Fultz / James Howe
    This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutro...
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    107,00 €