LIBROS DEL AUTOR: a p thijssen

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  • Testability Concepts for Digital ICs
    A.P. Thijssen / Frans Beenker / Roger Bennetts
    Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding...
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